First Joint of Advanced Electron Microscopy School and Workshop on Nanomaterials (AEM-NANOMAT'09) - Second Announcement

General Information

The First Joint of Advanced Electron Microscopy School and Workshop on Nanomaterials (AEM-NANOMAT'09) will be meeting in Saltillo , Coahuila Mexico at the Research Center for Applied Chemistry (CIQA).

The purpose of this Second Announcement is to provide the participants with more detailed information on the meeting program, organization and logistics. Attendance at this meeting can be the School or Workshop, as well as both. A Third Announcement will be distributed about a couple of weeks before the event as a reminder and to give some last minute information.

Objectives:

Learn from internationally renowned researchers and experts in a comprehensive program covering the latest developments in Advanced Electron Microscopy techniques for Nanomaterials: Scanning, Transmission and Scanning-Transmission Electron Microscopy and the specimen preparation using a Dual-Beam (SEM/FIB) system. The participation of young scientists and postgraduate students is most welcome .

For the Workshop on Nanomaterials, the participants can present their contributions in oral and poster presentations and publish their full articles in a specialized volume of Materials Science Forum ( http://www.scientific.net/MSF ), which covers all areas of Materials Science, Solid State Physics and Solid State Chemistry and is indexed by the ISI-Web CPCI.

The topics for the Advanced Electron Microscopy School and Workshop on Nanomaterials are:

 

Advanced Electron Microscopy School: Electron Diffraction: Electron crystallography HRTEM-HRSTEM: Quantitative analysis from the high resolution electron microscopy DUAL BEAM (SEM/FIB): specimen preparation and nanomachining Field emission gun for SEM and STEM: in-lens, low angle and others detectors

Nanomaterials: Multifunctional Nanocomposites Electronic and magnetic materials Smart materials Nanoparticles: synthesis and applications Microbeam Analysis Characterization Structure phenomena and modeling Growth of thin films Semiconductors and optoelectronic materials Other Nanomaterials and Interdisciplinary Topics

Important dates and deadlines

• 31 July 2009: Call for abstracts
• 07 August 2009: Authors notified of abstract acceptance
• 28 August 2009: School and workshop author registration deadline and Manuscript submission

General Program

Advanced Electron Microscopy School
Monday	Dual Beam (SEM/FIB) specimen preparation Field emission gun for SEM and STEM: in-lens, low angle and others detectors Theory and experimental demonstration: FEI - Dual-Beam Quanta 3D* Theory and experimental demonstration: Jeol - FEG-STEM JSM 7401F* *the demonstrations will be held at the Laboratory for Electron Microscopy (building G) permanently open on Monday and Tuesday
Tuesday	High resolution electron microscopy in transmission (HRTEM) and scanning-transmission (HAADF-STEM) modes Electron Diffraction, contrast diffraction, simulation and image analysis EELS advanced and Omega Filter for TEM applications Theory and experimental operation: FEI-Titan 80-300 kV* Theory and experimental remote operation: Jeol-JEM-2200FS* *FEI-Titan microscope will be held at the Laboratory for Electron Microscopy (building G) *Jeol-JEM-2200FS microscope will be operated via remote from the conference room to Laboratory for electron microscopy at the Ultra High Resolution Electron Microscopy Laboratory in the Mexican Institute of Petroleum
Wednesday
Workshop on Nanomaterials
Thursday	Symposia I Multifunctional NanocompositesElectronic and magnetic materials Smart materials	Symposia II Structure phenomena and modeling Microbeam Analysis Characterization
Friday	Symposia III Nanoparticles: synthesis and applications Other Nanomaterials and Interdisciplinary Topics Growth of thin films	Symposia IV Semiconductors and optoelectronic materials Other Nanomaterials and Interdisciplinary Topics

 

Local Organizer

Dr. Arturo Ponce Pedraza

Centro de Investigación en Química Aplicada (CIQA)
Blvd. Enrique Reyna Hermosillo 140,
Saltillo, Coahuila 25253
Mexico.
info@aem.ciqa.mx
Telephone +(52) 844 4389830 ext. 1404 / 1408 / 1393
Fax: +(52) 844 4389463
http://aem.ciqa.mx