>>Registration For participants ONLY attending the Advanced Electron Microscopy School or ONLY the Workshop on Nanomaterials also must to be registered on-line.

Scope of AEM-NANOMAT'09

The Research Center for Applied Chemistry (CIQA) in collaboration with the Mexican Microscopy Association and the Nanotechnology Node Network in Coahuila are announcing the First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT'09) to be held at the Research Center for Applied Chemistry in Saltillo (Coahuila) Mexico from September 28th to October 2nd 2009.

Attendance at this meeting will allow you to:

• Learn from internationally renowned researchers and experts in a comprehensive program covering the latest developments in Advanced Electron Microscopy techniques for Nanomaterials: Scanning and Transmission Electron Microscopy as well as specimen preparation using a Dual-Beam (SEM/FIB) system.

• Present your latest research in oral and poster sessions. The AEM-NANOMAT organization provides the opportunity to attend ONLY to the Workshop on Nanomaterials.

• Interact and promote scientific exchanges with interdisciplinary colleagues that are interested on recent developments in all branches of fundamental and applied Nanotechnology and Nanomaterials.

The AEM School program will include keynote and invited lectures, as well as experimental session. Moreover, it will address state of the art topics, practical problems and solutions in the physics and chemistry of Nanomaterials.

Participation of young scientists and postgraduate students is encouraged.

The AEM-NANOMAT will focus on the following topics:

Advanced Electron Microscopy School: Electron Diffraction: Electron crystallography HRTEM-HRSTEM: Quantitative analysis from the high resolution electron microscopy DUAL BEAM (SEM/FIB): specimen preparation and nanomachining Field emission gun for SEM and STEM: in-lens, low angle and others detectors

Nanomaterials: Multifunctional Nanocomposites Electronic and magnetic materials Smart materials Nanoparticles: synthesis and applications Microbeam Analysis Characterization Structure phenomena and modeling Growth of thin films Semiconductors and optoelectronic materials Other Nanomaterials and Interdisciplinary Topics

Important dates and deadlines

• 17 August 2009: New deadline for abstract submission

• 19 August 2009: Abstract acceptance notification

• 28 August 2009: Author registration and manuscript submission deadline

The Joint AEM-NANOMAT is organized by the Laboratory of Microscopy and the Department of Advanced Materials at the Research Center for Applied Chemistry (CIQA) in collaboration with the Mexican Microscopy Association and the Nanotechnology Node Network of Coahuila State.